| Type of Document |
Master's Thesis |
| Author |
Ledbetter, Christopher Michael
|
| Author's Email Address |
cledbetter69@yahoo.com |
| URN |
etd-12012005-170108 |
| Title |
Automated bench setup to characterize and test integrated circuits efficiently |
| Degree |
Master of Science in Electrical Engineering |
| Department |
Electrical and Computer Engineering |
| Advisory Committee |
| Advisor Name |
Title |
| Dr. Parten |
Committee Chair |
| Dr. Cox |
Committee Member |
|
| Keywords |
- IC Testing
- Automated
- LABView
- testing
|
| Date of Defense |
2005-11-04 |
| Availability |
unrestricted |
Abstract
Discusses the importance of testing of integrated circuits and different testing techniques. The creation of the automated bench test setup is shown and the process to create on discussed. A specific part is picked to demonstrate an automated bench tester. The test setup, generation of the test signals, the programs required to automate the equipment, and the results are presented. LabVIEW is used to control and automate the test setup. It is an excellent at collecting, processing, and sending data.
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| Files |
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